Semiconductors’ atomic defects now detectable with ultrafast lasers
Physicists at Michigan State University (MSU) have developed a new method to analyze semiconductors at the atomic level. This approach combines high-resolution microscopy with ultrafast lasers to detect semiconductor “defects” like never before. Led by Tyler Cocker, the Jerry Cowen Endowed Chair in Experimental Physics at MSU, the research aims to overcome a long-standing challenge. …